JPH0425663Y2 - - Google Patents
Info
- Publication number
- JPH0425663Y2 JPH0425663Y2 JP567384U JP567384U JPH0425663Y2 JP H0425663 Y2 JPH0425663 Y2 JP H0425663Y2 JP 567384 U JP567384 U JP 567384U JP 567384 U JP567384 U JP 567384U JP H0425663 Y2 JPH0425663 Y2 JP H0425663Y2
- Authority
- JP
- Japan
- Prior art keywords
- input
- test
- board
- output contact
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 71
- 230000006837 decompression Effects 0.000 claims description 11
- 239000004020 conductor Substances 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP567384U JPS60118975U (ja) | 1984-01-17 | 1984-01-17 | プリント板試験治具 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP567384U JPS60118975U (ja) | 1984-01-17 | 1984-01-17 | プリント板試験治具 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60118975U JPS60118975U (ja) | 1985-08-12 |
JPH0425663Y2 true JPH0425663Y2 (en]) | 1992-06-19 |
Family
ID=30482392
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP567384U Granted JPS60118975U (ja) | 1984-01-17 | 1984-01-17 | プリント板試験治具 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60118975U (en]) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10976660B2 (en) | 2016-09-13 | 2021-04-13 | Changzhou Tronly Advanced Electronic Materials Co , Ltd. | Fluorene photoinitiator, preparation method therefor, photocurable composition having same, and use of same in photocuring field |
US11118065B2 (en) | 2017-02-17 | 2021-09-14 | Changzhou Tronly Advanced Electronic Materials Co., Ltd. | Fluorenylaminoketone photoinitiator, preparation method thereof, and UV photocurable composition containing same |
-
1984
- 1984-01-17 JP JP567384U patent/JPS60118975U/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10976660B2 (en) | 2016-09-13 | 2021-04-13 | Changzhou Tronly Advanced Electronic Materials Co , Ltd. | Fluorene photoinitiator, preparation method therefor, photocurable composition having same, and use of same in photocuring field |
US11118065B2 (en) | 2017-02-17 | 2021-09-14 | Changzhou Tronly Advanced Electronic Materials Co., Ltd. | Fluorenylaminoketone photoinitiator, preparation method thereof, and UV photocurable composition containing same |
Also Published As
Publication number | Publication date |
---|---|
JPS60118975U (ja) | 1985-08-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS63304180A (ja) | 印刷回路板テスト装置 | |
JP2002175859A (ja) | スパイラルコンタクタ、これを用いた半導体検査装置及び電子部品 | |
WO2012023180A1 (ja) | 接続装置、それを備えた半導体ウェハ試験装置、及び接続方法 | |
KR20010030367A (ko) | 콘택트 핀을 장착하기 위한 핀 블럭 구조물 | |
EP0248521A2 (en) | Electrical contactors | |
CN110058116A (zh) | 一种连接器pin在内腔的测试机构 | |
JPH0425663Y2 (en]) | ||
CN201112691Y (zh) | 电连接器及使用这种电连接器的电连接器组件 | |
KR100202326B1 (ko) | Ic 소켓 | |
US6483331B2 (en) | Tester for semiconductor device | |
JPH034941Y2 (en]) | ||
KR100476590B1 (ko) | 반도체 디바이스 테스트 소켓 | |
CN211043570U (zh) | 一种单面pcb的测试装置 | |
CN110672998B (zh) | 一种连接器的导通耐压测试方法和导通耐压测试组件 | |
CN114487690A (zh) | 一种多芯线缆测试电路及测试方法 | |
CN211017466U (zh) | 显示面板检测用转接装置 | |
CN109212275B (zh) | 一种马达控制中心抽屉开关试验转接装置和试验方法 | |
CN220207690U (zh) | 测试插座 | |
KR20220154956A (ko) | 고속의 ssd 번인 소켓 및 ssd 컨트롤러 칩 동시 테스트를 위한 번인 보드 | |
JP3090255U (ja) | プローブ構造 | |
CN218272595U (zh) | 一种测试板卡搭源验证板 | |
JPH07130801A (ja) | 半導体ic試験装置におけるハンドラ測定用ソケット。 | |
CN118731825A (zh) | 一种电能表兼容测试装置 | |
CN214101604U (zh) | 一种摄像头模组的高效测试装置 | |
CN209280817U (zh) | 一种磁芯测量系统 |